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Page Title:
Cartridge, Delay M114 Assembly, Drawing 8596110. |
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| MIL-C-60570B
4.5.1.2 Lot size. Unless otherwise specified (see 6.2), the production lot size shall be not more than 1200.
4.5.2 Examination and tests. The quality conformance sample shall be subjected to the examinations
of 4.6 and all the test procedures of 4.7 except for 4.7.7.
4.6 Examination. All cartridges and components shall be examined visually and radiographically and
characteristics defined in accordance with the applicable drawings. One hundred percent examination shall
be performed for all critical defects. Examination for major or minor defects shall be performed on a defect
basis in accordance with the classification of defects. Four power (4 X) magnification may be used in
performing visual examination for such defects as burrs and foreign matter. When compliance is in doubt as
a result of visual inspection, the characteristic shall be measured or gaged to determine acceptability. All
nonconforming items shall be rejected.
4.6.1 Cartridge, Delay M114 Assembly, Drawing 8596110.
Characteristic
Defect
Method of Inspection
Critical
1
Any part missing
X-ray/Visual
2
Improper assembly
X-ray/Visual
3
Mixed delay elements or propellant
Visual
4
Metal defective
Visual
5
Crimp missing or incorrect
Visual
6
Marking missing, incorrect or illegible
Visual
Major
101
Cartridge profile failure
Gage
102
Diameter of body, max
Gage
103
Diameter of head, max
Gage
104
Location of datum diameter
Gage
105
"O" ring split, cracked or cut
Visual
106
Protective finish inadequate or defective
Visual
107
Foreign matter present
Visual
108
Burr
Visual
Minor
201
Total length, max
Gage
202
Case damaged
Visual
203
Varnish inadequate or missing
Visual
4.6.2 Delay element, M13, Drawing 8596113, covering a detail of Drawing 8596110.
Characteristic
Defect
Method of Inspection
Critical
7
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