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QUALITY CONFORMANCE INSPECTION
CLASSIFICATION OF DEFECTS & TESTS
MIL-C-64025(AR)
TITLE
DRAWING NUMBER
PARAGRAPH
Microcircuit, Linear, Driver, Dual CMOS
4.4.2.43
11
9333705
SHEET
OF
NEXT HIGHER ASSEMBLY
9333580/9333585
NO. OF
AQL
SAMPLE
EXAMINATION OR TEST
OR
CATEGORY
REQUIREMENT
PARAGRAPH REFERENCE
100%
UNITS
PARAGRAPH
/lNSPECTION METHOD
Critical
None defined
Major
101
Screening
not
performed
100%
MIL-STD-883,  Method
5004, Class B/
Certification
102
Conformance
testing
1/
MIL-STD-883,  Method
5005, Class B/
Certification
Minor
201
Marking  incorrect
O. 65%
Visual
202
Poor  workmanship
0.65%
Visual
1/ Sampling plan shall be per applicable paragraphs of MIL-M-3851O, Appendix B.
Replaces DRSMC-QA (D) Form 160, 1 Aug 83, which may not be used.
AMSMC Form 1570, 1
Feb 85

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