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|  QUALITY CONFORMANCE INSPECTION
CLASSIFICATION OF DEFECTS & TESTS
MIL-C-64025(AR)
TITLE
DRAWING NUMBER
PARAGRAPH
Transistor, NPN
(JAN2N222A)
4.4.2.72
I OF 1
MIL-S-19500/255
SHEET
NEXT HIGHER ASSEMBLY
9333595/9333590
L
NO. OF
AQL.
SAMPLE
REQUIREMENT
PARAGRAPH REFERENCE
OR
E X A M I N A T I O N OR TEST
CATEGORY
q ARAGRAPH
100%
UNITS
/lNSPECTION METHOD
Critical
None defined
Major
101
Wire material incorrect
32
Note 1
3.2
Visual
Wire bond
102
32
Note 1
3.2
Pull Tester (Note 2)
103
MIL-S-19500/255 compliance
3.2
Certification
104
Solderability (3 leads)
0.40%
3.5.1
MIL-STD-202,
Method 208
105
Leakage current ice
3.2
0.40%
MIL-STD-750,
Method 3041, Cond. B
106
Internal visual
Note 3 LTPD 10% 3.2
MIL-STD-750,
Method 2072, Para 3.2
only
Minor
201
Poor workmanship
0.65%
3.20
Visual
(2) Pull all wire.
(1) Reject for three (3) or more defects.
(3)
Sampling
per
MIL-M-3851O, Appendix B.
Replaces DRSMC-OA (D) Form 160, 1 A U g 83. which may not be u s e d .
AMSMC Form 1570, 1 Feb 85
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