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|  QUALITY CONFORMANCE INSPECTION
CLASSIFICATION OF DEFECTS & TESTS
M
I
L
-
C
-
6
4
0
2
5
(
A
R
)
TITLE
DRAWING NUMBER
PARAGRAPH
4.4.2.74
Transistor, PNP (JAN2N2907A)
1
1
MIL-S-19500/291
SHEET
OF
NEXT HIGHER ASSEMBLY
9333590
AQL
NO. OF
CATEGORY
EXAMINATION OR TEST
SAMPLE
REQUIREMENT
PARAGRAPH REFERENCE
UNITS
100%
PARAGRAPH
/lNSPECTION METHOD
None defined
Critical
Major
101
Wire material incorrect
32
Note 1
3.2
Visual
102
Wire bond
32
Note 1
3.2
Pull Tester (Note 2)
103
MIL-S-19500/291 compliance
3.2
Certification
104
Solderability (3 leads)
0.40%
3.5.1
MIL-STD-202,
Method 208
105
Leakage current ice
0.40%
3.2
MIL-STD-750,
Method 3041, Cond. B
106
Internal visual
Note
LTPD 10 % 3.2
MIL-STD-750,
Method 2072, Para 3.2
only
Minor
201
Poor workmanship
O. 65%
3.20
Visual
Reject for three (3) or more defects.
(1)
(2) Pull all wire.
(3) Sampling per
MIL-M-38510 , Appendix B.
Replaces DRSMC-QA (D) Form 160, 1 Aug 83, which
not be used.
AMSMC Form 1570, 1 Feb 85
may
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