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|  MIL-C-64030(AR)
4.4
Quality conformance inspection.
4.4.1 Inspection lot formation. Inspection lots shall comply
with the lot formation provisions of MIL-A-48078. In addition,
inspection lots of electronic assemblies and sub-assemblies shall
contain:
a. Crystal, quartz bearing the same lot interfix number
from one manufacturer.
b. Filters, ladder bearing the same lot interfix number
from one manufacturer.
c. Microcircuits, digital, 4096 bit (512x8) UV erasable
PROM bearing the same lot interfix number from one manufacturer.
d. Microcircuits, digital, CMOS, 8 bit microprocessor
bearing the same lot interfix number from one manufacturer.
e. Microcircuits, digital, CMOS, command output
synchronizer bearing the same lot interfix number from one
manufacturer.
f. Microcircuits, digital, CMOS, decoder logic array
bearing the same lot interfix number from one manufacturer.
g. Microcircuits, linear, amplifier, bipolar HF front
end bearing the same lot inter fix number from one manufacturer.
h.
Circuit card assemblies, digital logic.
i.
Circuit card assemblies, radio frequency receiver.
See MIL-A-48078.
4.4.2
Examination.
a. Sampling plans. Unless otherwise specified in the
Classification of Defects and Test Tables, sampling plans and
procedures for major and minor defects shall be in accordance with
MIL-STD-105, Normal Inspection Level II. (See Classification of
Defects)
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