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MIL-D-60572B
4.7.3 Delay element x-ray. Prior to assembly into a cartridge, the delay element shall be radiographically
examined in accordance with MIL-STD-453. Each delay element shall be x-rayed with the sides of the delay
element perpendicular to the rays. The x-ray negatives shall be identified by item nomenclature and by lot
number. Delay elements are to be left mounted to the boards or trays until after the x-rays have been reviewed
and defects identified to facilitate removal of defective units. After screening, the x-ray negatives with
defectives identified shall be forwarded to the engineering activity designated by the procuring activity.
4.7.4 Vibration test. Twelve of the 21 assembled delay elements of the first article sample, x-rayed as
directed in 4.7.3 and properly identified, shall be subjected to a vibration test. The method and procedures for
performing the vibration test shall be in accordance with MIL-STD-810, Method 514.3, Test Procedure I, Test
Condition I-3.2.5 (see 6.2). Then the 12 vibrated delay elements shall be x-rayed again. Evidence of any
disintegration of the ignition device, propellant, or derangement of any component shall be cause for rejection
of the sample. When there is a change in the method of charging the delay element or in the lot of ignition
devices, twelve additional delay elements shall be selected and tested as indicated herein.
4.7.5 Functional. The following tests shall be performed by the Government.
4.7.5.1 Ballistics.
4.7.5.1.1 First article. Twenty one assembled delay elements of the first article sample shall be grouped and
temperature conditioned as described in table III and 4.8. Following removal from the conditioning chamber,
the delay element shall be tested as required by 3.6.1.2. Failure of delay element to comply with 3.6.1.2 shall
be cause for sample rejection.
4.7.5.1.2 Production lot acceptance. Twenty one assembled delay elements from each production lot shall
be grouped and temperature conditioned in accordance with 3.6.1.2. Failure of a delay element to comply with
3.6.1.2 shall be cause for rejection of the lot. In addition to the sample of delay elements for the above test,
10 additional delay elements shall be furnished from each production lot for investigative purposes.
4.7.5.2 Retest. There shall be no retests.
4.7.5.2.1 Test failure. If a test failure is attributable to an assignable cause, excluding the test cartridge, the
original test results shall be discarded and that test reconducted.
4.8  Temperature conditioning. The conditioning chamber shall be preconditioned to the specified
temperature. Once the temperature inside the chamber has stabilized, the samples shall be placed inside and
maintained at the specified temperature for 4 hours minimum, 24 hours maximum.
4.8.1 Reconditioning. The sample must be tested within five minutes after removal from the conditioning
chamber. If this time is exceeded, the cartridge shall be reconditioned in accordance with 4.8.
4.9 Inspection of packaging. The sampling and inspection of the preservation, packing, and container
marking shall be in accordance with the requirements of section 5.
5. PACKAGING
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