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Page Title:
Self-Destruct (SD) mode destructive tests (Real Time) |
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|  MIL-E-48630(AR)
4.5.26 Self-Destruct (SD) mode destructive tests (Real Time).
A randomly selected sample of electronics assemblies P/N 9342552-1,
-2/9342552-1, -2, with simulated resistive load for the parallel
detonators, shall have their batteries activated by electric battery
primer, drawing 9292624 and allowed to function in "Real Time" as
follows:
Functioning shall be at hot, cold, and ambient.
a.
b. SD functioning shall be part of lot acceptance tests.
Observation shall be made for compliance with requirement of Dwg.
9287153. Units under test shall be conditioned at +145F,
-25F, and +75F.
c. Through use of fixtures and/or inclosures, the sample
units shall be protected from radio frequency and magnetic field
effect during the time interval covering activation of batteries
through functioning.
d. If an electronic assembly fails to function by the
maximum set self-destruct time, a valid target signature shall be
applied (using a simulated prime target sensor signature coil). Any
assembly failing to function (Non-hazardous dud) or functioning by
sensor after SD time (Hazardous dud) shall be set aside for
dismantling and failure analysis.
e.
Event time shall be monitored and recorded.
5. PREPARATION FOR DELIVERY
5.1 Preservation and packaging. The electronic assemblies
shall be preserved and packaged in accordance with MIL-STD-1169,
Level C.
5.2 Packing.
Packing of the assemblies shall be in accordance
with MIL-STD-1169, Level B.
5.3 Marking.
Marking shall be in accordance with MIL-STD-1169.
5.4 Shipping. When shipments from more than one lot are
shipped as a carload, each lot shall be kept separate and the
division between lots clearly indicated to prevent mixing of lots in
transit.
6.
NOTES
6.1 Intended use. The component covered by this specification
is intended for use in the M718/M741 System.
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