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Page Title:
Table VII. Conditioning Screen Defects |
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|  MIL-F-48267 (PA)
4.3.2.1 Pre-Cap Visual (dwg. 9255865).
4.3.3 TESTING
4.3.3.1 Bond Strength, (see 3.4) Major Defect, Code No.
10001. - Twenty (20) IC's shall be randomly selected from each
lot and tested in accordance with 4.4.1. The lot shall be re-
jected if one (1) or more IC'S are classed defective.
4.3.3.2 Lead Fatigue (see 3.5) Major Defect, Code No.
11002. - Six (6) IC's shall be randomly selected from each hour's
production. That hour's production shall be classed defective,
if one (1) or more of the devices are classed defective, Testing
shall be in accordance with 4.4.2.
4.3.3.3 Conditioning Screen Tests, (see 3.6) Major Defects,
The conditioning tests of Table No. 7 shall be performed in the
sequence shown in accordance with Table No. 7 and 4.4.3.
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