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Page Title:
Table 11. Group A Final Static Low Temperature Electrical Parameters |
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|  MIL-F-48267 (PA)
and in accordance with 4.4.8. Any XC classed defective shall
be removed from the lot. After testing, those IC's that are
not classed defective shall be sent to the dynamic tests of
4.3.3.9.
4.3,3.9 Dynamic Parameter (see 3.12) Major Defect, Code
No. 18001. The lot shall be screened 100 percent following the
static tests for the specified requirement in accordance with 4.4.9.
Any IC classed defective shall be removed from the lot.
4.3.3.10 Group B Environment Tests, (see 3.13) Major De-
fects. - The IC's shall be tested for the requirements of Table
NO. 12 once every six (6) weeks on a continuous basis while the
device is being produced. Testing shall be in accordance with
MIL-STD-883 and 4.4,10.
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