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MIL-F-48267 (PA)
Further lots shall not be shipped if the devices of any
sub-group fail to comply with all of the specified requirements.
4.3.3.11 Group C Environment Tests, Major Defects. - The
IC's shall be tested for the requirements of Table No. 13 on a
continuing schedule while the device is being produced.  Testing
shall be in accordance with MIL-STD-883 and 4.4.11.
26

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