 |
|||
|
|
|||
| ||||||||||
|
|  MIL-F-48673 (AR)
....
Required Data Pattern
Test Set TP
Scope Chan.
UIEQ
Table VI
B08
1
LRF
Complement of LRF
D09
2
LF2F
Record the results in data sheet.
401
TEST SELECT Setting:
d.
Required Data Pattern
Test Set TP
Scope Chan.
Signal
Table VI
A12
1
EASM
Complement of EASM
BO1
2
EAS MA
Record the results in data sheet.
400
TEST SELECT Setting:
e.
..
Required Data Pattern
Test Set TP
Scope Chan.
Signal
20 microsec logic "O" ,
B08
1
LRF
every 100
+
1 0%
Complement of LRF
B09
2
LRF
Record the results in data sheet.
Memory control test.
4.6.11
4.6.11.1 Waveform test. Set the TEST SELECT thumbwheel
switches as specified below. Utilizing the oscilloscope,us~ in
tests per paragraph 4.5.1.4.7 (set-up as specified therein except
as changed in this paragraph) and connected to the stipulated TEST
POINTS, observe the required waveforms.
|
|
Privacy Statement - Press Release - Copyright Information. - Contact Us |
Click
here for thousands of PDF manuals