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|  MIL-M-38510/101H
TABLE II. Electrical test requirements.
MIL-STD-883
Subgroups (see table III)
test requirements
Class S
Class B
devices
devices
Interim electrical parameters
1
1
(method 5004)
Final electrical test parameters 1/
1,2,3,4
1,2,3,4
(method 5004)
Group A test requirements
1,2,3,4,5,6,
1,2,3,4,5,6,7
(method 5005)
7,8A,8B,12,
13A,13B
Group C end point and group B,
1,2,3, and
1 and table IV
class S, electrical parameters
table IV delta
delta limits
(method 5005)
limits
Additional electrical subgroups
Not applicable
8A,8B,12,
For group C periodic inspections
13A,13B
Group D end point electrical
1,2,3
1
parameters (method 5005)
1/ PDA applies to subgroup 1 (see 4.2d).
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-M-38510 and methods
5004, 5005, and 5007, as applicable, of MIL-STD-883, except as modified herein. For devices marked with the "Q"
certification mark, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the
device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or
function as function as described herein.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to qualification and quality conformance inspection. The following additional criteria shall apply:
a.
Burn-in (method 1015 of MIL-STD-883).
1.
For class S devices: Test condition D using the circuit shown on figure 7.
2.
For class B devices: Test condition D using the circuit shown on figure 7 or test condition C using the circuit
shown on figure 8, or test condition F using the circuit (or equivalent) shown on figure 9.
b.
Reverse bias burn-in (method 1015 of MIL-STD-883). For class S devices only using the circuit shown on figure 8.
c.
Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test
prior to burn-in is optional at the discretion of the manufacturer.
d.
The percent defective allowable (PDA) for class S and class B devices shall be as specified in MIL-M-38510, based
on failures from group A, subgroup 1 test after cooldown as final electrical test in accordance with method 5004 of
MIL-STD-883 and with no intervening electrical measurements. If interim electrical parameter tests are performed
prior to burn-in, failures resulting from pre burn-in screening may be excluded from the PDA. If interim electrical
parameter tests prior to burn-in are omitted, then all screening failures shall be included in the PDA. The verified
failures of group A, subgroup 1 after burn-in divided by the total number of devices submitted for burn-in in that lot
shall be used to determine the percent defective for that lot, and the lot shall be accepted or rejected based on the
PDA for the applicable device class.
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