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Figure 4. Test circuit for static and dynamic tests notes |
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|  MIL-M-38510/101H
NOTES:
1/
These voltages in mV shall be measured to four place accuracy to provide required resolution in PSRR and CMR.
2/
Precautions shall be taken to prevent damage to the device under test during insertion into socket and change
of switch positions (example, disable voltage supplies, current limit VCC, etc.).
3/
If this alternate CMR test is used, these resistors shall be of .01 percent tolerances matched to .001 percent.
4/
Device types 02, 05, and 06 only, test both halves for all tests. The idle half of the dual amplifiers shall be
maintained in this configuration where V1 is midway between +VCC and -VCC, or the manufacturer has the
option to connect the idle half in a VIO configuration such that the inputs are maintained at the same common
mode voltage as the device under test.
5/
Compensation: for device types 03, 04, 05, and 06 only, equals 30 pF; for device type 07 only, equals 330 pF (optional).
6/
Device types 01, all case types, and device type 02, case outlines A, B, C, and D only.
7/
Device types 03 and 05 only.
8/
See figure 10. Noise test circuit.
9/
As required, if needed to prevent oscillation. Also, proper wiring procedures shall be followed to prevent oscillation.
Loop response and settling time shall be consistent with the test rate such that any value has settled for at least
five loop time constants before the value is measured.
10/ Adequate settling time shall be allowed such that each parameter has settled to within five percent of its final value.
11/ The nulling amplifier is an M38510/10101XXX. Saturation of the nulling amplifier is not allowed on test where
the "E" value is measured.
12/ All resistors 0.1 percent tolerance except as noted (note 3).
13/ For device types 01, 02, 07, and 08: RS = 20 kΩ. For device types 03 and 05: RS = 100 kΩ.
For device types 04 and 06: RS = 5.0 MΩ.
14/ Device type 07 only, this capacitor = 1,000 pF maximum to prevent oscillations.
15/ Device type 07 only.
16/ To minimize thermal drift, the reference voltages for gain measurements (E3 and E4) shall be taken immediately
prior to or after the reading corresponding to device gain (E24, E25, E26, E27, E30, E31, E32, and E33).
The gain at RL = 10 kΩ is essentially the gain at RL = 2 kΩ is influenced by thermal gradients on the die resulting
from power dissipation in the output stage. Hence, it is not linear and may not even be a true approximation of the
gain between other than the specified operation points.
17/ Any oscillation greater that 300 mV in amplitude (pk - pk) shall be cause for device failure.
18/ Although switches are depicted as toggle switches, any switching mechanism may be used provided the switching
action is achieved without adversely affecting the measurement.
19/ The load resistors (2,050 Ω and 11.1 kΩ) yield effective load resistances of 2 kΩ and 10 kΩ, respectively.
20/ The equations take into account both the gain of 1,000 and the scale factor multiplier, so that the calculated value
is in table III units. Therefore, use measured value / units in the equations, example E1 (volts).
FIGURE 4. Test circuit for static and dynamic tests- Continued.
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