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MIL-M-38510/108A
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a.
End point electrical parameters shall be as specified in table II herein.
b.
The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit
shall be maintained under document control by the device manufacturer's Technology Review Board (TRB)
in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1005 of MIL-STD-883.
Operating life test (method 1005 of MIL-STD-883) 1/.
c.
Test condition
B
A 2/
Product assurance class
S
B
S
B
125C
125C
250C
200C
TA minimum
t minimum
1000 hours
1000 hours
100 hours
100 hours
or 200C
1000 hours
Sample size series number
5
5
10
10
Note:
1/ The vertical columns of this table establish alternate combinations of test conditions
from which the manufacturer may choose any one for a given product class, at their
option, unless otherwise specified in the procurement documentation.
2/ See 4.2b.
d.
Steady state reverse bias (method 1005 of MIL-STD-883).
Test condition
A
Product assurance class
S
150C
TA minimum
t minimum
72 hours
Sample size series number
5
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point
electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified as follows.
4.5.1 Voltage and current. All voltage values given are referenced to the microcircuit ground terminals. Currents
given are conventional current and positive when flowing into the referenced terminal.
8

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