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Page Title:
Table 3. Group A inspection for device type 02-cont. |
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|  TABLE III. Group A inspection for device type 02 Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Subgroup
Symbol
Cases A,C,D
Limits
Note
BQ2
CQ2
BQ3
EQ3
CQ3
BQ4
EQ4
CQ4
BQ5
EQ5/
CQ5
CQ1
BQ1
EQ1, 2
Measured
Test no.
Min
Max
Unit
SUB
terminal
1
3 V/
GND
GND
IB
BQ2
70
1
69
hFE
TA = +25C
1 mA
GND
3 V/
"
IB
BQ3
"
1
"
70
1 mA
GND
3 V/
"
IB
BQ4
"
1
"
71
1 mA
"
3 V/
IB
BQ5
"
1
"
72
1 mA
GND
"
3 V/
IB
BQ1
60
2
"
73
10 mA
3 V/
"
GND
IB
BQ2
"
2
"
74
10 mA
GND
3 V/
"
IB
BQ3
"
2
"
75
10 mA
IB
GND
3 V/
"
"
76
BQ4
60
2
10 mA
"
3 V/
IB
"
77
BQ5
60
2
10 mA
"
hFEQ1/hFEQ2
78
--
0.9
1.1
3
"
hFEQ1/hFEQ3
79
--
"
"
4
"
hFEQ1/hFEQ4
80
--
"
"
5
"
hFEQ1/hFEQ5
81
--
"
"
6
2
35 V
GND
"
ICBO
82
CQ1
200
nA
TA = +125C
GND
35 V
"
"
83
CQ2
"
"
GND
35 V
"
"
84
CQ3
"
"
GND
35 V
"
"
85
CQ4
"
"
GND
"
35 V
"
86
CQ5
"
"
NOTES:
1. hFE = 1 mA/IB
4. hFE(68)/hFE(70)
2. hFE = 10 mA/IB
5. hFE(68)/hFE(71)
3. hFE(68)/hFE(69)
6. hFE(68)/hFE(72)
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