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Page Title:
Table 3. Group A inspection for device type 02-cont. |
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|  TABLE III. Group A inspection for device type 02 Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Subgroup
Symbol
Cases A,C,D
Limits
Note
BQ2
CQ2
BQ3
EQ3
CQ3
BQ4
EQ4
CQ4
BQ5
EQ5/
CQ5
CQ1
BQ1
EQ1, 2
Min
Max
Unit
Test no.
Measured
SUB
terminal
4
GND
GND
3 V/
BQ4
60
1
177
Ib
hfe
TA = +25C
1 mA
GND
3 V/
178
BQ5
60
1
Ib
hfe
1 mA
179
CQ1
300
MHz
2
ft
"
180
CQ2
"
2
"
181
CQ3
"
2
"
182
CQ4
"
2
"
183
CQ5
"
2
5
3 V/
GND
GND
184
BQ1
60
1
Ib
hfe
TA =
1 mA
+125C
"
3 V/
GND
BQ2
"
"
"
185
Ib
1 mA
"
GND
3 V/
BQ3
"
"
"
186
Ib
1 mA
"
GND
3 V/
"
187
BQ4
"
"
Ib
1 mA
"
3 V/
"
188
BQ5
"
"
Ib
1 mA
5
3 V/
GND
"
189
BQ1
35
"
Ib
hfe
TA = -55C
1 mA
"
GND
3 V/
BQ2
"
"
"
190
Ib
1 mA
"
GND
3 V/
BQ3
"
"
"
191
Ib
1 mA
"
GND
3 V/
"
192
BQ4
"
"
Ib
1 mA
"
3 V/
"
193
BQ5
"
"
Ib
1 mA
7
"
C.S.
194
CQ4
80
dB
3
TA = +25C
NOTES:
1. Adjust Ib until IC = 1.1 mA, hfe = 0.1 mA/ĆIb
2. f = 100 MHz, measure hfe, ft = 100hfe (see figure 4)
3. See figure 3.
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