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MIL-M-38510/125B
TABLE II. Electrical test requirements.
Subgroups (see table III)
MIL-PRF-38535
Class S
Class B
test requirements
devices
devices
Interim electrical parameters
1
1
Final electrical test parameters
1*, 2, 3
1*, 2, 3
Group A test requirements
1, 2, 3, 7, 8
1, 2, 3, 7, 8
Group B electrical test parameters when
1, 2, 3 and
N/A
using the method 5005 QCI option
table IV delta
limits
Group C end-point electrical
1, 2, 3 and
1 and table IV
parameters
table IV delta
delta limits
limits
Group D end-point electrical
1, 2, 3
1
parameters
*PDA applies to subgroup 1.
4. VERIFICATION.
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or
as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not
affect the form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior
to qualification and quality conformance inspection. The following additional criteria shall apply:
a.
The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified
in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be
maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c.
Additional screening for space level product shall be as specified in MIL-PRF-38535. Reverse bias
burn-in shall apply to class S devices only.
NOTE: If accelerated high-temperature test conditions are used (condition F), the device manufacturer shall
ensure that at least 85 percent of the applied voltage is dropped across the device at temperature.
The device is not considered functional under accelerated test conditions.
8

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