TABLE III. Group A inspection Continued.
16/ Step the logic input from 5 V to 0 V with the input at 0 V. After a 2 µs time delay, step the signal input up to 10 V.
For this condition the device under test output should be ≈ 0 V. Gradually decrease the delay until a 100 mV (.01 %)
shift occurs at the tester sample/hold output. Repeat the above procedure for input signal transitions of 10 V to 0 V,
0 V to 10 V, and 10 V to 0 V. The delay corresponding to the 100 mV shift is equal to the aperture time.
See figures 12 through 15.
17/ Settling time is determined as shown on figure 18 as the time for the S/H to settle within 1 mV of final value after the
hold command is given.
18/ Dynamic feedthrough rejection is determined in the hold mode with a signal input of 20 VPP at a frequency of 1 kHz.
19/ Overshoot TR(OS) and settling time TR(ts) are indicative of the stability of the device
20/ Broadband noise en(S) and en(H) is measured with a 10,000 V/V low noise bandpass amplifier as shown on figure 17.
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or
order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need
to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by
the Inventory Control Point's packaging activity within the Military Service, or Defense Agency, or within the military service's
system command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's
automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.