Click here to make your Home Page

Page Title: Abbreviations, symbols, and definitions.
Back | Up | Next

Click here for thousands of PDF manuals




Information Categories
.... Administration
Food and Cooking
Nuclear Fundamentals


6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the
time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have
actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are
urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that
they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information
pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43218-3990.
6.4 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-38510 in
this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this
specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid
adversely impacting existing government logistics systems and contractor's parts lists.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535, MIL-HDBK-1331, and as follows:
Gain error. The ratio of "sample" mode output voltage swing to input common mode
voltage swing expressed in percent. To the user this can be interpreted as the
percentage deviation from unity gain.
DR(+), DR(-)
Droop rate. The rate of change of hold capacitor voltage with time due to "hold"
mode leakage current. Note that IHL= CH x ĆVHC / Ćt = CH x DR.
Dynamic sampling error. The error introduced into the held output due to a
changing analog input when the "hold" command is given. This error is proportional
to the product of input signal slew rate, hold capacitance, and the series charge
Noise. The total rms noise of the device that exists within a 10 Hz to 10 kHz
en(S), en(H)
"brickwall" bandwidth. Both "sample" mode, en(S), and "hold" mode, en(H),
specifications exist.
Feedthrough rejection ratio. The ratio in dB of an input voltage change to a "hold"
mode output voltage change.
Hold capacitor charge current. The current that the input amplifier can supply to
ICH(+), ICH(-)
charge up the hold capacitor.
Hold mode leakage current. The input bias current of the output buffer amplifier.
IHL(+), IHL(-)
This leakage current causes a droop rate error of the external hold capacitor.
Input bias current. The current flowing into the signal input for any rated common
mode voltage condition.
Logic input current. The current into a mode control input for a forward bias (high
state), IIH, condition or a below threshold (low state), IIL, condition.
Output short circuit current. The "sample" mode output short circuit current to
IOS(+), IOS(-)
ground with +10 V and ­10 V applied at the input for IOS(+) and IOS(-), respectively.
Power supply rejection ratio. The ratio in dB of the change in +VCC or ­VCC voltage
to the change in offset voltage measured at the output with the opposite ­VCC or
+VCC voltage held constant.

Privacy Statement - Press Release - Copyright Information. - Contact Us