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TABLE III. Group A inspection for device type 07 Continued.
Terminal conditions 12/
Case C, D
1
2
3
4
5
6
7
8
9
10
11
12
13
14
MIL-
Test limits
Symbol
STD-883
Reset
Reset
Reset
Reset
Subgroup
Meas.
Output
Output
Input
Output
Output
Input
Test No.
NC
GND
VCC
method
terminal
QC
QB
BD
QD
QA
NC
A
Min
Max
Unit
R0(1)
R0 (2)
R9 (1)
R9 (2)
7
Func-
3014
103
A
B
B
4.5 V
B
B
H
L
GND
L
L
B
tional
"
104
B
"
"
"
"
"
"
H
"
"
"
"
TC = 25C
tests 5/
"
105
A
"
"
"
"
"
"
H
"
"
"
"
"
"
106
A
"
"
"
A
A
L
L
"
H
H
"
"
"
107
B
"
"
"
A
A
"
"
"
"
"
"
See 7/
"
"
108
B
"
"
"
B
B
"
"
"
"
"
"
"
"
109
A
"
"
"
"
"
"
"
"
"
"
"
"
"
110
A
A
A
"
"
"
"
"
"
L
L
"
"
"
111
B
A
A
"
"
"
"
"
"
L
L
"
8
Repeat subgroup 7 at TC = 125C and TC = -55C.
Fig 8
112
GND
GND
5.0 V
GND
GND
11/
9
11/
GND
11/
OUT 10/
IN
QA
10
MHz
FMAX 8/
"
113
9/
"
"
"
"
"
OUT 10/
10/
"
11/
9/ 10/
IN
QC
20
100
ns
TC = 25C
tPLH1
"
114
9/
"
"
"
"
"
OUT 10/
10/
"
11/
9/ 10/
IN
QC
20
100
ns
tPHL1
"
115
"
"
"
"
"
11/
10
11/
"
11/
OUT 10/
IN
QA
10
MHz
FMAX 8/
"
116
9/
"
"
"
"
"
OUT 10/
10/
"
11/
9/ 10/
IN
QC
20
115
ns
TC = 125C
tPLH1
"
117
9/
"
"
"
"
"
OUT 10/
10/
"
11/
9/ 10/
IN
QC
20
115
ns
tPHL1
11
Same test terminal conditions and limits as subgroup 10, except TC = -55C.
1/ Momentarily apply 2.0 V, then ground prior to taking measurements to set the device in desired state. Maintain ground for measurement.
2/ Apply 4.5 V pulse then ground prior to taking measurements to set the device in the desired state. Maintain ground for measurement.
3/ Apply one pulse after reset (R0) pulses.
4/
Apply two pulses after reset (R0) pulses.
5/
Only a summary of attributes data is required.
6/
A > 2.0 V, B < 0.8 V. Input voltages shown are the maximum for VIL and the minimum for VIH.
7/
Output voltages shall be either:
(a) H = 2.4 volts minimum and L = 0.4 volt maximum when using a high speed checker double comparator, or
(b) H > 1.5 volts and L < 1.5 volts when using a high speed checker single comparator.
8/
FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
9/
Connect terminals together during test.
10/
See test figure 8 for terminal load.
11/
Omit specified loads for this test.
12/
Terminal conditions (pins not designated may be H > 2.0 V, or L < 0.8 V, open).
13/
The limits shown shall be as follows:
Min/Max limits (ma) for circuit:
Test
A
B
C
-0.4/-1.3
-0.4/-1.3
-0.7/-1.6
IIL1
-1.4/-3.2
-0.7/-3.2
-0.7/-3.2
IIL2
-1.4/-4.8
-0.7/-4.8
-1.4/-6.4
IIL3

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