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Page Title:
Figure 4. Switching test circuit and data to output waveforms for device types 01 and 02. |
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|  MIL-M-38510/15B
NOTES:
1. The D input pulse generator has the following characteristics: VGEN = 3 V, t1 = t0 ≤ 10 ns, tP = 30 ns, t(SETUP) =
25 ns, t(HOLD) = 5 ns, PRR = 1 MHz and ZOUT ≈ 50 Ω.
2. The clock pulse generator has the following characteristics: VGEN = 3 V minimum, t1 = t0 ≤ 10 ns, tP(CLOCK) =
500 ns, and PRR = 1 MHz.
3. Prior to testing the device shall be precondition to a high logic level for waveform A and to a low logic level for
waveform B.
4. Each latch is tested separately.
5. CL = 50 pF, which includes probe and jig capacitance.
6. RL = 390 Ω 5%.
7.
The Q waveforms are not applicable to type 02.
8.
All diodes are 1N3064 or equivalent.
Figure 4. Switching test circuit and data to output waveforms for device types 01 and 02.
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