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Page Title:
Table 3. Group A inspection for device type 02 |
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|  TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0V or low ≤ 0.8 V or open).
Subgroup
Case E & F
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Test limits
Symbol
MIL-
Meas.
STD-883
terminal
Min Max Unit
Test No.
1D
2D
2Q
GND
Clock
3Q
3D
4D
4Q
VCC
Clear
1Q
1Q
2Q
3Q
4Q
method
1
VI C
1
-12 mA
GND
4.5 V
Clear
-1.5
V
TC = 25C
"
2
-12 mA
"
"
1D
"
"
"
3
-12 mA
"
"
2D
"
"
"
4
"
-12 mA
"
Clock
"
"
"
5
"
-12 mA
"
3D
"
"
"
6
"
-12 mA
"
4D
"
"
VOH
3007
7
2.0 V
-.8 mA
2.0 V
"
B
"
1Q
2.4
"
"
"
8
"
2.0 V
-.8 mA
"
"
"
2Q
"
"
"
"
9
"
"
"
-.8 mA
2.0 V
"
3Q
"
"
"
"
10
"
"
"
2.0 V
-.8 mA
"
4Q
"
"
"
"
11
0.8 V
-.8 mA
"
"
"
"
1Q
"
"
12
"
-.8 mA
"
"
"
"
2Q
"
"
13
"
"
-.8 mA
"
"
"
3Q
"
"
14
"
"
-.8 mA
"
"
"
4Q
VOL
"
15
2.0 V
16 mA
2.0 V
"
B
"
0.4 V
"
1Q
"
"
16
"
2.0 V
16 mA
"
"
"
"
"
2Q
"
"
17
"
"
"
16 mA
2.0 V
"
"
"
3Q
"
"
18
"
"
"
2.0 V
16 mA
"
"
"
4Q
"
"
19
0.8 V
16 mA
"
"
1Q
"
"
"
"
20
"
16 mA
"
"
2Q
"
"
"
"
21
"
"
16 mA
"
3Q
"
"
"
"
22
"
"
16 mA
"
4Q
"
"
IIL1
3009
23 CKT A,C,D
"
0.4 V
5.5 V
Clock
-0.7
-1.6
mA
"
"
23 CKT B
"
0.4 V
"
Clock
-0.3
-0.8
"
"
"
23 CKT E
"
0.4 V
"
Clock
-0.4
-1.3
"
IIL2
"
24 CKT A,D,E
0.4 V
"
"
Clear
-0.4
-1.3
"
IIL2
"
24 CKT B,C
0.4 V
"
"
Clear
-0.7
-1.6
"
IIL3
"
25
0.4 V
"
"
1D
-0.3
-0.8
"
"
"
26
0.4 V
"
"
2D
"
"
"
"
"
27
"
0.4 V
"
3D
"
"
"
"
"
28
"
0.4 V
"
4D
"
"
"
A
IIH1
3010
29
2.4 V
"
"
Clear
40
"
"
30
2.4 V
"
"
1D
"
"
"
"
31
2.4 V
"
"
2D
"
"
"
"
32
"
2.4 V
"
Clock
"
"
"
"
33
"
2.4 V
"
3D
"
"
"
"
34
"
2.4 V
"
4D
"
"
IIH2
"
35
5.5 V
"
"
Clear
100
"
"
"
36
5.5 V
"
"
1D
"
"
"
"
37
5.5 V
"
"
2D
"
"
"
"
38
"
5.5 V
"
Clock
"
"
"
"
39
"
5.5 V
"
3D
"
"
"
"
40
"
5.5 V
"
4D
"
"
See notes at end of device type 02.
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