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Technology Conformance inspection (TCI). |
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|  MIL-M-38510/207E
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-
38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM
plan shall not affect the form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices
prior to qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-
883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appendix B.
d. Class B devices processed to an altered item drawing may be programmed either before or after
burn-in at the manufacturer's discretion. The required electrical testing shall include, as a
minimum, the final electrical tests for programmed devices as specified in table II herein.
Class S devices processed by the manufacturer to an altered item drawing shall be programmed
prior to burn-in.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
Qualification data for subgroups 7 through 11 shall be by attributes only.
4.3.1 Qualification extension. When authorized by the qualifying activity, for qualification inspection, if a
manufacturer qualifies faster device type which is manufactured identically to slower device types on this
specification, then the slower device types may be qualified by conducting only group A electrical tests and
any electrical specified as additional group C subgroups and submitting data in accordance with MIL-PRF-
38535 (for example, groups B, C, and D tests are not required).
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance
with MIL-PRF-38535 and as specified herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Electrical test requirements shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 shall be omitted.
c. For unprogrammed devices, a sample shall be selected to satisfy programmability requirements prior
to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to programming (see
3.3.2.1). If more than 2 devices fail to program, the lot shall be rejected. At the manufacturer's
option, the sample may be increased to 24 total devices with no more than 4 total device failures
allowed.
d. For unprogrammed devices, 10 devices from the programmability sample shall be subjected to the
requirements of group A, subgroups 9, 10, and 11. If more than two total devices fail in all three
subgroups, the lot shall be rejected. At the manufacturer's option, the sample may be increased to 20
total devices with no more than 4 total device failures allowable.
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