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Page Title:
Table 3. Group A inspection for device types 02 and 04-cont. |
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TABLE III. Group A inspection Continued.
10/ SEQUENTIAL (PROGRAMMED PROM).
This program will test all bits in the array for tPHL2 and tPLH2.
Description:
Step 1.
Each word in the pattern is tested from the enable lines to the output lines for recovery.
Step 2.
Word 0 is addressed. Enable line is pulled high to low and low to high. tPHL2 and tPLH2 are read.
Step 3.
Word 1 is addressed. Same enable sequence as above.
Step 4.
The reading procedure continues until word 255 is reached.
Step 5.
Pass execution time = 256 x cycle time.
The sequential tests shall be performed with VCC = 4.5 V and 5.5 V.
Step 6.
11/ For unprogrammed 01, 02 devices (with date codes before 8601), apply 10.0 V to pin 10 ( A0 ), apply 0.5 V to
pin 11 ( A1 ), and other 5.0 V on all other addresses for circuit C.
12/ For unprogrammed 02 devices ( VOH test ), with date codes before 8713, apply 0 V to pins 10 ( A0 ) through
13 ( A3 ), and 11.5 V to pin 14 ( A4 ), with date codes of 8713 or later apply 3.0 V to pins 10 ( A0 ) through
13 ( A3 ), and 10.5 V to pin 14 ( A4 ) for circuit G.
13/ For unprogrammed devices 01, 02 (with date codes of 8601 or later), 03 and 04, apply 10.0 V to pin 10 ( A0 ),
0.5 V to pins 12, 13, 14, ( A2, A3, A4 ) and 5.0 V to all other addresses for circuit C.
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