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Figure 12. Synchronous switching test circuit (low-level data) for device types 05 and 07-cont.
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Microcircuits, Digital, TTL, Flip-Flops, Monolithic Silicon
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Figure 14. Synchronous switching test circuit for device type 06.



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MIL-M-38510/2G
NOTES:
1. Preset or clear function can occur only when clock input is low. Gated inputs are inhibited.
2. All diodes are 1N3064, or equivalent.
3. CL = 50 pF, minimum, including jig and probe capacitance.
4. Clear or preset input pulse characteristics: Vgen = 3.0 V, to = 5 ns, t1 10 ns, tp = 25 ns.
5. RL = 3905%.
FIGURE 13. Clear and preset switching test circuit and waveforms for device types 06.
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