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Figure 13. Clear and preset switching test circuit and waveforms for device types 06.
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Microcircuits, Digital, TTL, Flip-Flops, Monolithic Silicon
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Figure 15. Input clamp voltage test circuit for device types 01, 02, 03, and 04 (circuit B).



img
MIL-M-38510/2G
NOTES:
1. Clock input pulse has the following characteristics: Vgen = 3 V, t1 = t0 10 ns, tp = 30 ns, and
PRR = 1 MHz. When testing fMAX, PRR = see table III.
2. All diodes are 1N3064, or equivalent.
3. CL = 50 pF minimum including jig and probe capacitance.
4. RL = 3905%
FIGURE 14. Synchronous switching test circuit for device type 06.
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