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Page Title: Figure 15. Input clamp voltage test circuit for device types 01, 02, 03, and 04 (circuit B).
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Figure 14. Synchronous switching test circuit for device type 06.
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Table 3. Group A inspection for device type 01.



img
MIL-M-38510/2G
NOTES:
1. Apply normal clock pulse, then sink -12 mA on the clock input.
2. The output Q is measured after -12 mA is applied to the clock to insure it is still in the low state.
FIGURE 15. Input clamp voltage test circuit for device types 01, 02, 03, and 04 (circuit B).
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