Click here to make tpub.com your Home Page

Page Title: Table 3. Group A inspection for device type 03 notes
Back | Up | Next

Click here for thousands of PDF manuals

Google


Web
www.tpub.com

Home

   
Information Categories
.... Administration
Advancement
Aerographer
Automotive
Aviation
Construction
Diving
Draftsman
Engineering
Electronics
Food and Cooking
Logistics
Math
Medical
Music
Nuclear Fundamentals
Photography
Religion
   
   

 

Share on Google+Share on FacebookShare on LinkedInShare on TwitterShare on DiggShare on Stumble Upon
Back
Table 3. Group A inspection for device type 03-cont.
Up
Microcircuits, Digital, TTL, Flip-Flops, Monolithic Silicon
Next
Table 3. Group A inspection for device type 04



img
NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
C = This note has been deleted.
D = Momentary 4.5 V, then GND.
E = Momentary ground, then 2.4 V.
F = Momentary ground, then 5.5 V.
* After clock pulse apply 12 mA to clock pin to insure Q is still in the low state (see figure 15).
** Test time limit 100 ms.
1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open).
2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b)
H 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence.
5/ One normal clock pulse, then 4.5 V.
6 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
7/ For CKT A, IIH3 limits are 0 to 120 A.

Privacy Statement - Press Release - Copyright Information. - Contact Us

Integrated Publishing, Inc.
9438 US Hwy 19N #311 Port Richey, FL 34668

Phone For Parts Inquiries: (727) 755-3260
Google +