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Table 3. Group A inspection for device type 04-cont.
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Microcircuits, Digital, TTL, Flip-Flops, Monolithic Silicon
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Table 3. Group A inspection for device type 05



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NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
C = This note has been deleted.
E = Momentary ground, then 2.4 V.
F = Momentary ground, then 5.5 V.
** = Test time limit 100 ms.
J = This note has been deleted.
1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open.)
2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b)
H 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence.
5 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.

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