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Table 3. Group A inspection for device type 05
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Microcircuits, Digital, TTL, Flip-Flops, Monolithic Silicon
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Table 3. Group A inspection for device type 05-cont.



img
TABLE III. Group A inspection for device type 05. 1/ - Continued.
Subgroup
Symbol
MIL-STD-
Case A, B D
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
883
Meas.
Case C
3
2
1
14
13
12
11
10
9
8
7
6
5
4
method
terminal
Test No.
Clock 1
D1
Clear 1
VCC
GND
Clear 2
D2
Clock
Preset
Q2
Q1
Preset
Min
Max
Unit
Q2
Q1
2
1
1
IOS
3011
49
5.5 V
GND
GND
GND
Q1
-20
-57
mA
TC = 25°C
"
"
50
GND
"
"
GND
"
"
"
Q1
"
"
"
51
"
GND
GND
"
Q2
"
"
"
"
"
"
52
"
GND
GND
"
"
"
"
Q2
"
ICC
3005
53
GND
GND
"
GND
GND
GND
"
GND
VCC
30
"
"
ICC
3005
54
GND
GND
GND
"
GND
GND
GND
"
VCC
30
"
2
Same tests, terminal conditions and limits as for subgroup 1, except TC = 125ēC and VIC tests are omitted.
3
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55ēC and VIC tests are omitted.
7 2/ 4/
55
B
B
B
4.5 V
B
B
B
B
H 3/
H 3/
GND
H 3/
H
B
All
H or L
TC = 25°C
56
B
B
B
"
B
B
B
A
L
H
"
H
L
A
outputs
as shown 3/
"
57
B
B
A
"
A
B
B
A
L
H
"
H
L
A
"
"
"
58
B
B
A
"
A
B
B
B
H
L
"
L
H
B
"
"
"
59
A
B
A
"
A
B
A
B
H
L
"
L
H
B
"
"
"
60
A
B
B
"
B
B
A
B
H
H
"
H
H
B
"
"
"
61
A
A
B
"
B
A
A
B
H
H
"
H
H
B
"
"
"
62
A
A
B
"
B
A
A
A
L
H
"
H
L
A
"
"
"
63
A
A
A
"
A
A
A
A
L
H
"
H
L
A
"
"
"
64
A
A
A
"
A
A
A
B
H
L
"
L
H
B
"
"
"
65
A
A
A
"
A
A
A
A
H
L
"
L
H
A
"
"
"
66
B
A
A
"
A
A
B
A
H
L
"
L
H
A
"
"
"
67
B
B
A
"
A
B
B
A
H
L
"
L
H
A
"
"
"
68
A
B
A
"
A
B
A
A
L
H
"
H
L
A
"
"
"
69
A
B
A
"
A
B
A
B
H
L
"
L
H
B
"
"
"
70
A
A
B
"
B
A
A
B
H
H
"
H
H
B
"
"
"
71
A
B
B
"
B
B
A
B
H
H
"
H
H
B
"
"
"
72
A
B
B
"
B
B
A
A
L
H
"
H
L
A
"
"
"
73
A
B
A
"
A
B
A
A
L
H
"
H
L
A
"
"
"
74
B
A
A
"
A
A
B
A
L
H
"
H
L
A
"
"
"
75
A
A
A
"
A
A
A
A
H
L
"
L
H
A
"
"
"
76
A
A
A
"
A
A
A
B
H
L
"
L
H
B
"
"
"
77
A
A
A
"
A
A
A
A
H
L
"
L
H
A
"
"
"
78
A
A
B
"
B
A
A
A
L
H
"
H
L
A
"
"
"
79
A
A
A
"
A
A
A
A
L
H
"
H
L
A
"
"
"
80
A
B
A
"
A
B
A
B
H
L
"
L
H
B
"
"
"
81
A
B
A
"
A
B
A
A
H
L
"
L
H
A
"
"
"
82
A
B
B
"
B
B
A
A
L
H
"
H
L
A
"
"
"
83
A
B
A
"
A
B
A
A
L
H
"
H
L
A
"
"
"
84
A
A
A
"
A
A
A
A
L
H
"
H
L
A
"
"
8 2/ 4/
Same tests, terminal conditions and limits as for subgroup 7, except TC = 125ēC and -55ēC.
9
FMAX 6/
(Fig. 11)
85
IN
E
5.0 V
GND
OUT
5.0 V
Q1
10
MHz
TC = 25°C
"
"
86
IN
E
"
"
OUT
5.0 V
"
"
Q1
"
"
"
87
"
E
IN
5.0 V
OUT
"
Q2
"
"
"
"
"
"
88
"
E
IN
5.0 V
OUT
"
"
Q2
See notes at end of device type 05.

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