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Table 3. Group A inspection for device type 05-cont.
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Microcircuits, Digital, TTL, Flip-Flops, Monolithic Silicon
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Table 3. Group A inspection for device type 06



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See notes at end of device type 05.
TABLE III. Group A inspection for device type 05. 1/ - Continued.
Subgroup
Symbol
MIL-
Case A, B, D
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
STD-883
Meas.
Case C
method
terminal
Test No.
Clock 1
D1
Clear 1
VCC
GND
Q1
Clear 2
D2
Clock 2
Preset 2
Q2
Preset 1
Min
Max
Unit
Q2
Q1
10
tPLH2
3003 5/
117
IN
IN (A)
B
"
"
OUT
5.0 V
Clock 1
5
39
ns
TC = 125C
(Fig 11)
to Q1
"
(Fig 12)
118
IN
IN (A)
5.0 V
"
"
OUT
B
Clock 1
"
"
"
to Q 1
"
"
(Fig 11)
119
"
B
IN (A)
IN
5.0 V
OUT
"
Clock 2
"
"
"
to Q2
"
"
(Fig 12)
120
"
5.0 V
IN (A)
IN
B
OUT
"
Clock 2
"
"
"
to Q 2
"
tPHL2
(Fig 12)
121
IN
IN (B)
5.0 V
"
"
OUT
B
Clock 1
"
40
"
to Q1
"
"
(Fig 11)
122
IN
IN (B)
B
"
"
OUT
5.0 V
Clock 1
"
"
"
to Q 1
"
"
(Fig 12)
123
"
5.0 V
IN (B)
IN
B
OUT
"
Clock 2
"
"
"
to Q2
"
"
(Fig 11)
124
"
B
IN (B)
IN
5.0 V
OUT
"
Clock 2
"
"
"
to Q 2
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C.
11
NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
E = Input D connected to Q .
J = Input pulse, tp 100 ns, PRR = 1 MHz, VOL = 0 V, VOH = 4.5 V.
1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open).
2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b)
H 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence.
5/ Tests shall be performed for both D input pulses (A and B).
6 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
7/ CKT C limits are 0.7 to -4.8 mA for these tests.

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