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TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.7 V; or open).
MIL-STD-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Limits
A,B,C,D
883
Subgroup  Symbol  method  Cases 2,X
2
3
4
5
8
9
10
12
13
14
16
18
19
20
Measured
Unit
BIN
CIN
DIN
Mode
GND
CONT
CLK
QD
QC
QB
QA
VCC
terminal
Min
Max
Test no.  Serial
AIN
1
VOH
3006
1
2.0 V
0.7 V
GND
4.5 V
A
-1.0 mA 4.5 V
QA
2.4
V
Tc = 25C
2
2.0 V
2.0 V
"
"
"
-1.0 mA
"
QA
"
"
3
2.0 V
"
"
"
"
-1.0 mA
"
QB
"
"
4
2.0 V
"
"
"
"
-1.0 mA
"
QC
"
"
5
2.0 V
"
"
"
"
-1.0 mA
"
QD
"
"
VOL
3007
6
0.7 V
0.7 V
"
"
"
12 mA
"
QA
0.4
"
7
0.7 V
2.0 V
"
"
"
12 mA
"
QA
"
"
8
0.7 V
"
"
"
"
12 mA
"
QB
"
"
9
0.7 V
"
"
"
"
12 mA
"
QC
"
"
10
0.7 V
"
"
"
"
12 mA
"
QD
"
"
VIC
11
-18 mA
"
"
Serial
-1.5
"
12
-18 mA
"
"
AIN
"
"
13
-18 mA
"
"
BIN
"
"
14
-18 mA
"
"
CIN
"
"
15
-18 mA
"
"
DIN
"
"
16
-18 mA
"
"
Mode
"
"
17
"
-18 mA
"
CONT
"
"
18
"
-18 mA
"
CLK
"
"
Α
IIH1
3010
19
2.7 V
4.5 V
"
5.5 V
Serial
20
20
2.7 V
GND
"
"
AIN
"
"
21
2.7 V
"
"
"
BIN
"
"
22
2.7 V
"
"
"
CIN
"
"
23
2.7 V
"
"
"
DIN
"
"
24
2.7 V
"
"
Mode
"
"
25
"
2.7 V
"
CONT
"
"
26
"
2.7 V
"
CLK
"
"
IIH2
27
5.5 V
4.5 V
"
"
Serial
100
"
28
5.5 V
GND
"
"
AIN
"
"
29
5.5 V
"
"
"
BIN
"
"
30
5.5 V
"
"
"
CIN
"
"
31
5.5 V
"
"
"
DIN
"
"
32
5.5 V
"
"
Mode
"
"
33
"
5.5 V
"
CONT
"
"
34
"
5.5 V
"
CLK
"
"
IOZH
35
0.7 V
4.5 V
"
0.7 V
A
2.7 V
"
QA
20
"
36
0.7 V
"
"
"
"
2.7 V
"
QB
"
"
37
0.7 V
"
"
"
"
2.7 V
"
QC
"
"
38
0.7 V
"
"
"
"
2.7 V
"
QD
"
"
IOZL
39
2.0 V
"
"
"
"
0.4 V
"
QA
-20
"
40
2.0 V
"
"
"
"
0.4 V
"
QB
"
"
41
2.0 V
"
"
"
"
0.4 V
"
QC
"
"
42
2.0 V
"
"
"
"
0.4 V
"
QD
"
"
See footnotes at end of device types 06.

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