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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
E, F
Subgroup
Symbol
883
Cases 1/
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Limits
Unit
method
2, X
terminal
Test no.
B3
A<B
A=B
A>B
A>B
A=B
A<B
GND
B0
A0
B1
A1
A2
B2
A3
VCC
Min
Max
IN
IN
IN
OUT
OUT
OUT
9
tPHL1
3003
108
IN
GND
GND
OUT
GND
GND
GND
GND
GND
GND
GND
2.7 V
5.0 V
B3 to A < B
2
35
ns
Tc = 25C
Fig. 4
109
GND
"
"
"
"
IN
2.7 V
"
"
"
"
GND
"
B0 to A < B
"
"
"
"
110
"
GND
"
OUT
"
2.7 V
IN
"
"
"
"
"
"
A0 to A > B
"
"
"
"
111
"
"
GND
OUT
"
GND
GND
IN
2.7 V
"
"
"
"
B1 to A < B
"
"
"
"
112
"
GND
"
OUT
"
"
"
2.7 V
IN
"
"
"
"
A1 to A > B
"
"
"
"
113
"
"
"
"
"
"
"
GND
GND
IN
2.7 V
"
"
A2 to A > B
"
"
"
"
114
"
"
GND
OUT
"
"
"
"
"
2.7 V
IN
"
"
B2 to A < B
"
"
"
"
115
2.7 V
GND
OUT
"
"
"
"
"
GND
GND
IN
"
A3 to A > B
"
"
"
tPHL2
"
116
IN
2.7 V
OUT
"
"
"
"
"
"
"
GND
"
B3 to A = B
"
33
"
"
117
GND
"
"
"
IN
"
"
"
"
"
"
"
B0 to A = B
"
"
"
"
118
"
"
"
"
GND
IN
"
"
"
"
"
"
A0 to A = B
"
"
"
"
119
"
"
"
"
"
GND
IN
"
"
"
"
"
B1 to A = B
"
"
"
"
120
"
"
"
"
"
"
GND
IN
"
"
"
"
A1 to A = B
"
"
"
"
121
"
"
"
"
"
"
"
GND
IN
"
"
"
A2 to A = B
"
"
"
"
122
"
"
"
"
"
"
"
"
GND
IN
"
"
B2 to A = B
"
"
"
"
123
"
"
"
"
"
"
"
"
"
GND
IN
"
A3 to A = B
"
"
"
tPHL3
"
124
"
IN
GND
OUT
"
"
"
"
"
"
"
GND
"
A<B to A>B
"
20
"
"
125
"
GND
IN
"
"
"
"
"
"
"
"
"
"
A=B to A>B
"
"
"
tPHL5
"
126
"
IN
GND
OUT
"
"
"
"
"
"
"
"
"
A=B to A<B
"
20
"
"
127
"
GND
IN
"
"
"
"
"
"
"
"
"
"
A>B to A<B
"
"
"
tPHL4
"
128
"
IN
OUT
"
"
"
"
"
"
"
"
"
A=B to A=B
"
25
"
Same tests and terminal conditions as for subgroup 9, except TC = +125C and test limits as follows:
10
in minimum limits column limits for all tests are 2 ns; in maximum limits column, limits for tPLH1 and tPLH2 are 42 ns; tPLH3 are 25 ns, tPLH5 are 30 ns, tPLH4 are 28 ns
tPHL1 are 42 ns, tPHL2 are 39 ns, tPHL3 are 28 ns, tPHL5 are 26 ns, tPHL4 are 36 ns.
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C.
11
1/ Case X and 2 pins not referenced are NC.
2/ For circuit F, IIL1 limits are -0.5 to -400 A. For circuit B, IIL1 limits are -180 to -420 A.
3/ IIL2 limits (mA) min/max values for circuits shown:
Measured
Circuit
Terminal
A
B
C
D
E
F
B3
-0.03/-.30
-.40/-1.3
-.40/-1.2
-.40/-1.14
-.40/-1.14
-.28/-1.14
A = B IN
-.32/-1.14
-.40/-1.3
-.32/-1.2
-.32/-1.14
-.32/-1.14
-.14/-1.14
B0
-.20/-.60
-.40/-1.3
-.40/-1.2
-.40/-1.14
-.40/-1.14
-.28/-1.14
A0
-.20/-.60
-.40/-1.3
-.40/-1.2
-.40/-1.14
-.40/-1.14
-.28/-1.14
B1
-.40/-1.14
-.40/-1.3
-.40/-1.2
-.40/-1.14
-.40/-1.14
-.28/-1.14
A1
-.40/-1.14
-.40/-1.3
-.40/-1.2
-.40/-1.14
-.40/-1.14
-.28/-1.14
A2
-.40/-1.14
-.40/-1.3
-.40/-1.2
-.40/-1.14
-.40/-1.14
-.28/-1.14
B2
-.40/-1.14
-.40/-1.3
-.40/-1.2
-.40/-1.14
-.40/-1.14
-.28/-1.14
A3
-.20/-.60
-.40/-1.3
-.40/-1.2
-.40/-1.14
-.40/-1.14
-.28/-1.14
4/ For circuit B, IOS limits are -30 to -130 mA.
5/ Tests shall be performed in sequence.
6/ A = 3.0 V min;, B = 0.0 V or GND; H > 1.5 V; L < 1.5 V.
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