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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.7 V, or open). 1/
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-
E, F
Subgroup Symbol STD-883
Case
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Limits
Unit
method -
2
terminal
Q2
Cext2
Rext2
GND
A2
B2
CLR2
Q1
Cext1
Rext1
VCC
Test no.
A1
B1
CLR1
Min
Max
Q1
Q2
s
9
tP4
3003
72
OUT
I
I
GND
GND
IN
5.0 V
5.0 V
Q2
3.5
6.0
Tc = 25C
Fig. 3
73
OUT
I
I
"
IN
5.0 V
5.0 V
"
Q2
"
"
"
"
74
IN
5.0 V
5.0 V
"
OUT
I
I
"
Q1
"
"
"
"
75
GND
IN
5.0 V
"
OUT
I
I
"
Q1
"
"
"
Same tests and terminal conditions as subgroup 9, except TC = +125C and limits are as follows: tPLH1 is 5 to 57 ns; tPLH2 is 5 to 74 ns; tPLH3 is 5 to 75 ns;
10
tPHL1 is 5 to 75 ns; tPHL2 is 5 to 92 ns; tPHL3 is 5 to 48 ns; tP(MIN) is 308 ns; and tP4 is 3.0 to 6.25 s.
Same tests and terminal conditions as for subgroup 10, except TC = -55C
11
NOTES:
A. VIN = 3.0 V minimum.
B. VIN = 0.0 V or GND.
C.
Apply input pulse
┌────┐ - - - 2.5 V min/5.5 V max.
──┘
└── 0 V
D. Test numbers 39 through 55 shall be run in sequence.
E. Output voltages shall be either:
H > 1.5 V; L < 1.5 V
F. Rext = 5 kΩ minimum to 180 kΩ maximum, connected to VCC; Cext ≤ 1,000 F, connected to Rext terminal.
G. Rext = 5 kΩ 10%, connected to VCC.
Rext = 10 kΩ 10%, connect to VCC; Cext ≤ 1,000 F 10%, connected to Rext terminal.
I.
J. During subgroups 9, 10, 11 testing, Rext and Cext may remain applied on the side of the device not under test if desired.
K. For circuit D, IIL1 limits are 120 mA to 360 mA.
L. Rext = 10 kΩ 10%, connect to VCC; Cext ≥ 45 pF connected to Rext terminal.
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