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Page Title:
Table 3. Group A inspection for device type 01 and 04. |
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|  TABLE III. Group A inspection for device type 01 and 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Type 01
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Cases
E, F
Cases
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
2, X
Type 04
2
1
7
12
16
9
15
14
13
11
10
8
4
6
5
3
MIL-STD-
Cases
E, F
Subgroup
Symbol
883
Cases
3
2
9
15
20
12
19
18
17
14
13
10
5
8
7
4
Measured
Limits
Unit
method
2, X
terminal
Test no.
1D
2D
EN 3-4
VCC
3D
4D
4Q
3Q
GND
EN 1-2
2Q
1Q
Min
Max
1Q
4Q
3Q
2Q
1
VOH
3006
1
-0.4 mA
0.7 V
4.5 V
GND
1/
2.5
V
1Q
Tc = 25C
"
2
2.0 V
"
"
"
-0.4 mA
1Q
"
"
"
3
0.7 V
"
"
"
-0.4 mA
"
"
2Q
"
4
2.0 V
"
"
"
-0.4 mA
2Q
"
"
"
"
"
5
1/
"
0.7 V
-0.4 mA
"
3Q
"
6
"
"
2.0 V
-0.4 mA
"
3Q
"
"
"
7
"
"
0.7 V
-0.4 mA
"
"
"
4Q
"
8
"
2.0 V
-0.4 mA
"
4Q
"
"
0.4
"
VOL
3007
9
4 mA
2.0 V
"
"
1/
1Q
"
10
0.7 V
"
"
"
4 mA
1Q
"
"
"
11
2.0 V
"
"
"
4 mA
"
"
2Q
"
12
0.7 V
"
"
"
4 mA
2Q
"
"
"
"
"
13
1/
"
2.0 V
4 mA
"
3Q
"
14
"
"
0.7 V
4 mA
"
3Q
"
"
"
15
"
"
2.0 V
4 mA
"
"
"
4Q
"
16
"
"
0.7 V
4 mA
"
4Q
"
"
IIL1
3009
17
0.4 V
5.5 V
"
4.5 V
1D
4/
4/
mA
"
18
0.4 V
"
"
4.5 V
2D
"
"
"
"
19
4.5 V
"
0.4 V
"
3D
"
"
"
"
20
4.5 V
"
0.4 V
"
4D
"
"
"
IIL2
"
21
4.5 V
4.5 V
"
"
0.4 V
EN 1-2
"
"
"
"
22
0.4 V
"
4.5 V
4.5 V
"
EN 3-4
"
"
"
A
IIH1
3010
23
2.7 V
"
"
1D
20
"
24
2.7 V
"
"
2D
"
"
"
25
"
2.7 V
"
3D
"
"
"
26
"
2.7 V
"
4D
"
"
IIH2
"
27
"
"
2.7 V
EN 1-2
80
"
"
28
2.7 V
"
"
EN 3-4
80
"
IIH3
"
29
5.5 V
"
"
1D
100
"
"
30
5.5 V
"
"
2D
"
"
"
31
"
5.5 V
"
3D
"
"
"
32
"
5.5 V
"
4D
"
"
IIH4
"
33
"
"
5.5 V
EN 1-2
0.4
mA
"
34
5.5 V
"
"
EN 3-4
0.4
"
IOS
3011
35
GND
GND
"
"
4.5 V
-15
-100
"
1Q
"
36
4.5 V
"
"
"
GND
1Q
"
"
"
"
37
GND
"
"
"
GND
"
"
"
2Q
"
38
4.5 V
"
"
"
GND
2Q
"
"
"
"
39
4.5 V
"
GND
GND
"
"
"
"
3Q
"
40
"
"
4.5 V
GND
"
3Q
"
"
"
"
41
"
"
GND
GND
"
"
"
"
4Q
"
42
"
"
4.5 V
GND
"
4Q
"
"
"
ICC
3005
43
GND
GND
GND
"
GND
GND
"
GND
VCC
"
12
"
See footnotes at end of device type 01 and 04.
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