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Page Title:
Table 3. Group A inspection for device type 02-cont. |
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|  TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.7 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
E, F
Subgroup
Symbol
883
Cases
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Limits
Unit
method
2, X
terminal
Test no.
Min
Max
1Q
2Q
GND
3Q
4Q
VCC
1R
1S 1
1S 2
2R
2S
3R
3S 1
3S 2
4R
4S
9
tPHL2
3003
71
IN
4.5 V
4.5 V
OUT
GND
5.0 V
3
32
ns
1 R to 1Q
Tc = 25C
Fig. 4
72
IN
4.5 V
OUT
"
"
"
"
"
2 R to 2Q
"
73
"
OUT
IN
4.5 V
4.5 V
"
"
"
"
3 R to 3Q
"
74
"
OUT
IN
4.5 V
"
"
"
"
4 R to 4Q
10
tPLH1
"
35
"
TC =125C
Same tests and terminal conditions as for subgroup 9, except TC = +125C and test limits as shown
tPHL1
"
26
"
tPHL2
"
42
"
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C.
11
─┐ ┌─
1/ Apply a 3V - 5V
momentary pulse 500 ns minimum prior to measurement.
└──┘ 0 V
2/ A = 2.4 V, B = 0.4 V.
3/ H ≥ 1.5 V, L ≤ 1.5 V.
4/ IIL limits are as follows:
Min/max limits (mA)
Test
Circuit A
Circuit B
Circuit C
Circuit D
Circuit E
Tests
Limits
Tests
Limits
IIL
9, 12,
0/-0.2
-.16/-.40
-.135/-.370
9, 12,
-.001/-.15
-.16/-.40
14, 17
14, 17
10, 11, 13
0/-0.2
10, 11, 13
-.03/-.30
15, 16, 18
15, 16, 18
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