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TABLE III. Group A inspection for device type 02. 1/
Terminal conditions (pins not designated may be high 2.0 V; low 0.7 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
E, F
Subgroup
Symbol
883
Case 2/
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Limits
Unit
method
2
terminal
Test no.
1C
1G
B
1Y3
1Y2
1Y1
1Y0
GND
2Y0
2Y1
2Y2
2Y3
A
2G
2C
VCC
Min
Max
A
1
ICEX
1
2.0 V
5.5 V
GND
4.5 V
1Y0
100
Tc = 25C
2
"
5.5 V
"
"
1Y1
"
"
3
"
5.5 V
"
"
1Y2
"
"
4
"
5.5 V
"
"
1Y3
"
"
5
"
5.5 V
2.0 V
"
2Y0
"
"
6
"
5.5 V
"
"
2Y1
"
"
7
"
5.5 V
"
"
2Y2
"
"
8
"
5.5 V
"
"
2Y3
"
"
VOL
3007
9
2.0 V
0.7 V
0.7 V
4 mA
"
0.7 V
"
1Y0
0.4
V
"
10
"
"
0.7 V
4 mA
"
2.0 V
"
1Y1
"
"
"
11
"
"
2.0 V
4 mA
"
0.7 V
"
1Y2
"
"
"
12
"
"
2.0 V
4 mA
"
2.0 V
"
1Y3
"
"
"
13
0.7 V
"
4 mA
0.7 V
0.7 V
0.7 V
"
2Y0
"
"
"
14
0.7 V
"
4 mA
2.0 V
"
"
"
2Y1
"
"
"
15
2.0 V
"
4 mA
0.7 V
"
"
"
2Y2
"
"
"
16
2.0 V
"
4 mA
2.0 V
"
"
"
2Y3
"
"
VI C
17
-18 mA
"
"
1C
-1.5
"
18
-18 mA
"
"
1G
"
"
19
-18 mA
"
"
B
"
"
20
"
-18 mA
"
A
"
"
21
"
-18 mA
"
2G
"
"
22
"
-18 mA
"
2C
"
"
IIL1
3009
23
0.4 V
"
5.5 V
1C
3/
3/
mA
"
24
0.4 V
"
"
1G
"
"
"
"
25
0.4 V
"
"
B
"
"
"
"
26
"
0.4 V
"
A
"
"
"
"
27
"
0.4 V
"
2G
"
"
"
"
28
"
0.4 V
"
2C
"
"
"
A
IIH1
3010
29
2.7 V
"
"
1C
20
"
30
2.7 V
"
"
1G
"
"
"
31
2.7 V
"
"
B
"
"
"
32
"
2.7 V
"
A
"
"
"
33
"
2.7 V
"
2G
"
"
"
34
"
2.7 V
"
2C
"
"
IIH2
"
35
5.5 V
"
"
1C
100
"
"
36
5.5 V
"
"
1G
"
"
"
37
5.5 V
"
"
B
"
"
"
38
"
5.5 V
"
A
"
"
"
39
"
5.5 V
"
2G
"
"
"
40
"
5.5 V
"
2C
"
"
ICC
3005
41
4.5 V
GND
4.5 V
"
4.5 V
GND
GND
"
VCC
10
mA
Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted.
2
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted.
3
See footnotes at end of device type 02.

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