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TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high 2.0 V; low 0.7 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
E, F
Subgroup Symbol
883
Case
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Limits
Unit
method
2
terminal
Test no.
1CLK
1CLR
1QA
1ST9
1QB
1QC
1QD
GND
2QD
2QC
2QB
2ST9
2QA
2CLR
2CLK
VCC
Min
Max
1
VOH
3006
1
1/
2/
-0.4 mA
0.7 V
GND
4.5 V
1QA
2.5
V
Tc = 25C
"
2
3/
"
"
-0.4 mA
"
"
1QB
"
"
"
3
4/
"
"
-0.4 mA
"
"
1QC
"
"
"
4
0.7 V
2.0 V
-0.4 mA
"
"
1QD
"
"
"
5
"
0.7 V
-0.4 mA
2/
1/
"
2QA
"
"
"
6
"
-0.4 mA
"
"
3/
"
2QB
"
"
"
7
"
-0.4 mA
"
"
4/
"
2QC
"
"
"
8
"
-0.4 mA
2.0 V
0.7 V
"
2QD
"
"
VOL
3007
9
2.0 V
4 mA
0.7 V
"
"
1QA
0.4
"
"
10
"
"
4 mA
"
"
1QB
"
"
"
11
"
"
4 mA
"
"
1QC
"
"
"
12
"
"
4 mA
"
"
1QD
"
"
"
13
"
0.7 V
4 mA
2.0 V
"
2QA
"
"
"
14
"
4 mA
"
"
"
2QB
"
"
"
15
"
4 mA
"
"
"
2QC
"
"
"
16
"
4 mA
"
"
"
2QD
"
"
VI C
17
-18 mA
"
"
1CLK
-1.5
"
18
-18 mA
"
"
1CLR
"
"
19
-18 mA
"
"
1ST9
"
"
20
"
-18 mA
"
2ST9
"
"
21
"
-18 mA
"
2CLR
"
"
22
"
-18 mA
"
2CLK
"
"
IIL1
3009
23
0.4 V
"
5.5 V
1CLR
5/
5/
5/
IIL2
"
24
0.4 V
GND
GND
"
"
1CLK
"
"
"
IIL1
"
25
0.4 V
"
"
1ST9
"
"
"
IIL1
"
26
"
0.4 V
"
2CLR
"
"
"
IIL2
"
27
"
GND
GND
0.4 V
"
2CLK
"
"
"
IIL1
"
28
"
0.4 V
"
2ST9
"
"
"
A
IIH1
3010
29
2.7 V
"
"
1CLR
20
IIH2
"
30
2.7 V
"
"
1CLK
100
"
IIH1
"
31
2.7 V
"
"
1ST9
20
"
IIH1
"
32
"
2.7 V
"
2CLR
20
"
IIH2
"
33
"
2.7 V
"
2CLK
100
"
IIH1
"
34
"
2.7 V
"
2ST9
20
"
IIH4
"
35
5.5 V
"
"
1CLR
100
"
IIH5
"
36
5.5 V
"
"
1CLK
200
"
IIH4
"
37
5.5 V
"
"
1ST9
100
"
IIH4
"
38
"
5.5 V
"
2CLR
100
"
IIH5
"
39
"
5.5 V
"
2CLK
200
"
IIH4
"
40
"
5.5 V
"
2ST9
100
"
IOS
3011
41
1/
2/
GND
GND
"
"
1QA
-15
-100
mA
"
42
3/
"
"
GND
"
"
1QB
"
"
"
"
43
4/
"
"
GND
"
"
1QC
"
"
"
"
44
GND
5.5 V
GND
"
"
1QD
"
"
"
"
45
"
GND
GND
2/
1/
"
2QA
"
"
"
"
46
"
GND
"
"
3/
"
2QB
"
"
"
"
47
"
GND
"
"
4/
"
2QC
"
"
"
"
48
"
GND
5.5 V
GND
"
2QD
"
"
"
ICC
3005
49
GND
2/
GND
"
GND
2/
GND
"
VCC
26
"
Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted.
2
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted.
3
See footnotes at end of device type 03.

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