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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
MIL-STD-
E, F
Subgroup
Symbol
883
Cases
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Limits
Unit
method
2, X 1/
terminal
Test no.
A0
A1
A2
Min
Max
E3
GND
VCC
E1
E2
O7
O6
O5
O4
O3
O2
O1
O0
10
tPLH1
1.0
11.0
ns
tPHL1 Same tests and terminal conditions as for subgroup 9, except TC = 25C and limits as shown.
"
8.0
"
tPLH2
"
12.5
"
tPHL2
"
8.5
"
tPLH3
"
12.0
"
tPHL3
"
9.5
"
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C.
11
1/ For cases 2 and X pins not referenced are N/C.
2/ IIL limits (mA) min/max values for circuit shown:
Min/Max limits in mA for circuit
Parameter
Test no.
A
B
C
IIL
41 through 45
-.27/-.60
-.03/-.60
-.03/-.60
IIL1
46
-.22/-.60
-.03/-.60
-.03/-.60
3/ A = 3.0 V minimum, B = 0.0 V or GND, H > 1.5 V, L < 1.5 V.
4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
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