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TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.8 V; or open).
MIL-STD-
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Limits
E and F
883
method  Cases 2 1/
Subgroup
Symbol
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Unit
and X
Test no.
K1
J1
Q1
GND
Q2
terminal
Min
Max
J2
VCC
CP
SD
Q
Q
SD
CP
K
CD
CD
1
1
1
2
2
2
2
2
1
1
VOH
3006
1
2/
.8 V
2.0 V
2.0 V
-1 mA
GND
2.0 V
4.5 V
Q1
2.5
V
Tc = 25C
2
"
-1mA
2.0 V
2.0 V
.8 V
2/
2.0 V
"
Q2
"
"
3
2/
2.0 V
.8 V
2.0 V
-1 mA
"
2.0 V
"
"
"
Q
1
4
-1 mA
"
2.0 V
.8 V
2.0 V
2/
2.0 V
"
"
"
Q 2
5
4.5 V
4.5 V
4.5 V
.8 V
-1 mA
"
2.0 V
"
Q1
"
"
6
"
-1 mA
.8 V
4.5 V
4.5 V
4.5 V
2.0 V
"
Q2
"
"
7
4.5 V
4.5 V
4.5 V
2.0 V
-1 mA
"
.8 V
"
"
"
Q
1
8
-1 mA
"
2.0 V
4.5 V
4.5 V
4.5 V
.8 V
"
"
"
Q
2
VOL
3007
9
2/
.8 V
2.0 V
2.0 V
20 mA
"
2.0 V
"
.50
"
Q
1
10
20 mA
"
2.0 V
2.0 V
.8 V
2/
2.0 V
"
"
"
Q 2
11
2/
2.0 V
.8 V
2.0 V
20 mA
"
2.0 V
"
Q1
"
"
12
"
20 mA
2.0 V
.8 V
2.0 V
2/
2.0 V
"
Q2
"
"
13
4.5 V
4.5 V
4.5 V
.8 V
20 mA
"
2.0 V
"
"
"
Q
1
14
20 mA
"
.8 V
4.5 V
4.5 V
4.5 V
2.0 V
"
"
"
Q 2
15
4.5 V
4.5 V
4.5 V
2.0 V
20 ma
"
.8 V
"
Q1
"
"
16
"
20 mA
2.0 V
4.5 V
4.5 V
4.5 V
.8 V
"
Q2
"
"
VIC
17
-18 mA
"
"
-1.2
"
CP
1
18
-18 mA
"
"
K1
"
"
19
-18 mA
"
"
J1
"
"
20
-18 mA
"
"
"
"
SD
1
21
"
-18 mA
"
"
"
SD
2
22
"
-18 mA
"
J2
"
"
23
"
-18 mA
"
K2
"
"
24
"
-18 mA
"
"
"
CP
2
25
2.7 V
0V
0V
4.5 V
"
-18 mA
"
"
"
CD
2
26
2.7 V
0V
4/
"
"
-18 mA
"
"
"
CD
1
IIL1
3009
27
4.5 V
.5 V
4.5 V
2/
"
4.5 V
5.5 V
K1
3/
3/
mA
28
"
2/
4.5 V
.5 V
4.5 V
4.5 V
"
K2
"
"
"
29
4.5 V
4.5 V
.5 V
4.5 V
"
2/
"
J1
"
"
"
30
"
4.5 V
.5 V
4.5 V
4.5 V
2/
"
J2
"
"
"
IIL2
3009
31
4.5 V
4.5 V
4.5 V
4.5 V
"
.5 V
"
"
"
"
CD
1
32
"
4.5 V
4.5 V
4.5 V
4.5 V
.5 V
"
"
"
"
CD
2
33
4.5 V
4.5 V
4.5 V
.5 V
"
4.5 V
"
"
"
"
SD
1
34
"
.5 V
4.5 V
4.5 V
4.5 V
4.5 V
"
"
"
"
SD
2
IIL3
3009
35
.5 V
4.5 V
4.5 V
4.5 V
"
2/
"
"
"
"
CP
1
"
36
"
4.5 V
4.5 V
4.5 V
.5 V
2/
"
"
"
"
CP
2
See footnotes at end of device type 03.

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