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TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.8 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Limits
MIL-STD-
E and F
883
method  Cases 2 1/
Subgroup
Symbol
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Unit
and X
Test no.
K1
J1
Q1
GND
Q2
K2
terminal
Min
Max
J2
VCC
CP
SD
Q
Q
SD
CP
CD
CD
1
1
1
2
2
2
2
1
9
tPHL3
3003
111
2.7 V
2.7 V
2.7 V
IN
OUT
"
IN
"
2.5
7.7
"
CD
to Q1
1
Tc = +25C
2.7 V
2.7 V
IN
"
"
"
Fig. 4
112
"
OUT
IN
2.7 V
"
CD
to Q2
2
113
2.7 V
2.7 V
2.7 V
IN
OUT
"
IN
"
"
"
"
SD 1 to Q
1
114
OUT
"
IN
2.7 V
2.7 V
2.7 V
IN
"
"
"
"
SD 2 to Q
2
tPLH4
115
0V
2.7 V
2.7 V
IN
OUT
"
IN
"
2.0 V
7.0
"
SD 1 to Q1
116
"
OUT
IN
2.7 V
2.7 V
0V
IN
"
"
"
"
SD 2 to Q2
117
0V
2.7 V
2.7 V
IN
OUT
"
IN
"
"
"
"
CD
to Q
1
1
118
OUT
"
IN
2.7 V
2.7 V
0V
IN
"
"
"
"
CD
to Q
2
2
tPHL4
119
0V
2.7 V
2.7 V
IN
OUT
"
IN
"
2.5
7.7
"
CD
to Q1
1
120
"
OUT
IN
2.7 V
2.7 V
0V
IN
"
"
"
"
CD
to Q2
2
121
0V
2.7 V
2.7 V
IN
OUT
"
IN
"
"
"
"
SD 1 to Q
1
122
OUT
"
IN
2.7 V
2.7 V
0V
IN
"
"
"
"
SD 2 to Q
2
Same tests and terminal conditions as subgroup 9, except TC = +125C and use limits from table I.
10
Same tests and terminal conditions as subgroup 9, except TC = -55C and use limits from table I.
11
See footnotes at end of device type 03.

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