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TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.8 V; or open).
Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Limits
MIL-STD-
E and F
883
method  Cases 2 1/
Subgroup
Symbol
2
3
4
5
7
8
9
10
12
13
14
15
17
18
19
20
Measured
Unit
and X
Q0
D0
D1
GND
CP
Q2
D2
D3
Q3
VCC
terminal
Min
Max
Test no.
Q1
MR
Q
Q
Q
Q
0
1
2
3
1
IOS
3011
41
2/
0V
4.5 V
GND
2/
5.5 V
Q0
-60
-150
mA
Tc = 25C
4.5 V
0V
"
"
"
Q1
"
"
"
42
"
43
"
"
"
0V
4.5 V
"
Q2
"
"
"
44
"
"
"
4.5 V
0V
"
Q3
"
"
"
45
0V
0V
"
4.5 V
"
"
"
"
Q
0
46
"
0V
"
"
"
"
"
"
Q
1
47
"
"
"
0V
"
"
"
"
Q
2
48
"
"
"
0V
"
"
"
"
Q 3
IOD
3006
49
0V
2.5 V
"
4.5 V
Q0
60
"
50
"
2.5 V
"
"
Q1
"
"
51
"
"
2.5 V
"
Q2
"
"
52
"
"
2.5 V
"
Q3
"
"
53
5.5 V
2.5 V
5.5 V
5.5 V
"
4/
5.5 V
5.5 V
"
"
"
Q
0
54
"
"
"
2.5 V
"
"
"
"
"
"
"
Q
1
55
"
"
"
"
"
2.5 V
"
"
"
"
"
Q
2
56
"
"
"
"
"
"
"
2.5 V
"
"
"
Q
3
ICC
3005
57
4.5 V
4.5 V
4.5 V
"
4.5 V
4.5 V
5.5 V
VCC
34
"
Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125C and VIC tests are omitted.
2
Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55C and VIC tests are omitted.
3
See footnotes at end of device type 04.

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