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TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.8 V; or open).
MIL-STD-
Subgroup
Symbol
Cases 2, R,
11
12
13
14
15
16
17
18
19
20
Measured
Limits
S, and X
883
method
Test no.
CP
Q4
D4
D5
Q5
Q6
D6
D7
Q7
VCC
terminal
Min
Max
9
tPZL1
3003
144
1/
5.5 V
2.0
7.5
ns
OE to Q0
Tc = +25C
"
"
"
Fig. 4
145
"
"
OE to Q1
146
"
"
"
"
"
OE to Q2
147
"
"
"
"
"
OE to Q3
148
"
OUT
0V
"
"
"
"
OE to Q4
149
"
0V
OUT
"
"
"
"
OE to Q5
150
"
OUT
0V
"
"
"
"
OE to Q6
151
"
0V
OUT
"
"
"
"
OE to Q7
tPZH1
152
"
"
"
11.5
"
OE to Q0
153
"
"
"
"
"
OE to Q1
154
"
"
"
"
"
OE to Q2
155
"
"
"
"
"
OE to Q3
156
"
OUT
2.7 V
"
"
"
"
OE to Q4
157
"
2.7 V
OUT
"
"
"
"
OE to Q5
158
"
OUT
2.7 V
"
"
"
"
OE to Q6
159
"
2.7 V
OUT
"
"
"
"
OE to Q7
Same tests, terminal conditions, and limits as subgroup 9, except TC = +125C and use limits from table I.
10
Same tests, terminal conditions, and limits as subgroup 9, except TC = -55C and use limits from table I.
11
See footnotes at end of device type 05.

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