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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Subgroup Symbol
883
R, S, 2
Measured
Test limits
Unit
method
Test no.
S
QA
I0A
I1A
I1B
I0B
QB
GND
CP
QC
I0C
I1C
I1D
I0D
QD
VCC
terminal
Min
Max
QA
QB
QC
QD
A
1
IIH1
3010
43
2.7 V
GND
5.5 V
S
20
Tc = 25C
"
44
2.7 V
"
"
I0A
"
"
"
45
0.0 V
2.7 V
"
"
I1A
"
"
"
46
0.0 V
2.7 V
"
"
I1B
"
"
"
47
2.7 V
"
"
I0B
"
"
"
48
"
2.7 V
"
CP
"
"
"
49
"
2.7 V
"
I0C
"
"
"
50
0.0 V
"
2.7 V
"
I1C
"
"
"
51
0.0 V
"
2.7 V
"
I1D
"
"
"
52
"
2.7 V
"
I0D
"
"
IIH2
"
53
7.0 V
"
"
S
100
"
"
54
7.0 V
"
"
I0A
"
"
"
55
0.0 V
7.0 V
"
"
I1A
"
"
"
56
0.0 V
7.0 V
"
"
I1B
"
"
"
57
7.0 V
"
"
I0B
"
"
"
58
"
7.0 V
"
CP
"
"
"
59
"
7.0 V
"
I0C
"
"
"
60
0.0 V
"
7.0 V
"
I1C
"
"
"
61
0.0 V
"
7.0 V
"
I1D
"
"
"
62
"
7.0 V
"
I0D
"
"
IIL
3009
63
0.5 V
"
"
S
4/
4/
mA
"
64
0.0 V
0.5 V
"
"
I0A
"
"
"
"
65
5.5 V
0.5 V
"
"
I1A
"
"
"
"
66
5.5 V
0.5 V
"
"
I1B
"
"
"
"
67
0.0 V
.05 V
"
"
I0B
"
"
"
"
68
5.5 V
"
0.5 V
"
CP
"
"
"
"
69
0.0 V
"
0.5 V
"
I0C
"
"
"
"
70
5.5 V
"
0.5 V
"
I1C
"
"
"
"
71
5.5 V
"
0.5 V
"
I1D
"
"
"
"
72
0.0 V
"
0.5 V
"
I0D
"
"
"
IOS
3011
73
0.0 V
5.5 V
5.5 V
"
1/
"
QA
-60
-150
"
"
74
0.0 V
0.0 V
0.0 V
"
"
"
"
"
"
QA
"
75
0.0 V
0.0 V
0.0 V
"
"
"
"
"
"
QB
"
76
5.5 V
5.5 V
0.0 V
"
"
"
QB
"
"
"
"
77
"
"
0.0 V
5.5 V
5.5 V
"
QC
"
"
"
"
78
"
"
0.0 V
0.0 V
0.0 V
"
"
"
"
QC
"
79
"
"
0.0 V
0.0 V
0.0 V
"
"
"
"
QD
"
80
"
"
5.5 V
5.5 V
0.0 V
"
QD
"
"
"
IOD
81
2.5 V
0.0 V
0.0 V
"
"
4.5 V
QA
60
"
82
2.5 V
5.5 V
5.5 V
"
"
"
"
"
QA
83
5.5 V
5.5 V
2.5 V
"
"
"
"
"
QB
84
0.0 V
0.0 V
2.5 V
"
"
"
QB
"
"
85
"
"
2.5 V
0.0 V
0.0 V
"
QC
"
"
86
"
"
2.5 V
5.5 V
5.5 V
"
"
"
QC
"
"
87
"
"
5.5 V
5.5 V
2.5 V
"
QD
88
"
0.0 V
0.0 V
2.5 V
"
QD
"
"
ICC
3006
89
5.5 V 5.5 V 5.5 V
5.5 V
"
"
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
VCC
38
"
Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted.
2
Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted.
3
See footnotes at end of device type 01.
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