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Page Title:
Table 3. Group A inspection for device type 04-cont. |
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|  TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V; low ≤ 0.8 V; or open).
MIL-STD- Cases
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Subgroup Symbol
883
R, S, 2
Measured
Test limits
Unit
method
Test no.
1Q
1D
2D
2Q
3Q
3D
4D
4Q
GND
CLK
5Q
5D
6D
6Q
7Q
7D
8D
8Q
VCC
terminal
Min
Max
OC
9
tPLZ
3003
139
IN
OUT
GND
GND
1/
5.0 v
2
18
ns
OC to 1Q
Tc = 25C
(fig. 6)
140
"
GND
OUT
"
"
"
"
"
"
OC to 2Q
"
141
"
OUT
GND
"
"
"
"
"
"
OC to 3Q
"
142
"
GND
OUT
"
"
"
"
"
"
OC to 4Q
"
143
"
"
"
OUT
GND
"
"
"
"
OC to 5Q
"
144
"
"
"
GND
OUT
"
"
"
"
OC to 6Q
"
145
"
"
"
OUT
GND
"
"
"
"
OC to 7Q
"
146
"
"
"
GND
OUT
"
"
"
"
OC to 8Q
10
fMAX
30
MHz
tPLH1
4
20
ns
tPHL1
5
18
"
tPZH Same tests and terminal conditions as subgroup 9, except TC = +125C.
5
22
"
tPZL
7
20
"
tPHZ
2
12
"
tPLZ
3
24
"
Same tests as subgroup 10, except TC = -55C and use limits from table I.
11
1/ Apply
2.0 V min/4.5 V max
(pulse, prior to test).
-- 0 V
2/ IIL limits shall be as follows:
Min/Max limits in A for circuit
Parameters
A
B
C
IIL
0/-200
3/ Method 3011 of MIL-STD-883 shall be used, except the output shall be as specified herein, and the output current shall be operating rather than short circuit current.
The output conditions have been chosen to produce a current that closely approximates one half of the true short circuit output current, IOS.
4/ Tests shall be performed in sequence, attributes data only.
5/ A = 2.4 V, minimum, B = 0.4 V.
6/ X = indeterminate output voltage.
7/ H > 1.5 V, L < 1.5 V.
8/ fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
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