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Page Title:
Table 3. Group A inspection for device type 03-cont. |
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|  TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open).
Cases
13
14
15
16
17
18
19
20
21
22
23
24
MIL-STD-
K, L
Subgroup
Symbol
883
Case
16
17
18
19
20
21
23
24
25
26
27
28
Measured
Limits
Unit
method
3 1/
terminal
Test no.
EN2C
2Q4
2Q3
2Q2
2Q1
1Q4
1Q3
1Q2
1Q1
EN1C
VCC
Min
Max
2 CLR
9
tPHZ
3003
181
OUT
2/
5.0 V
2
8
ns
1 OC to 1Q1
Tc = 25
Fig. 4
182
OUT
"
"
"
"
"
C
1 OC to 1Q2
"
183
OUT
"
"
"
"
"
1 OC to 1Q3
"
184
OUT
"
"
"
"
"
1 OC to 1Q4
"
185
4.5 V
4.5 V
OUT
"
"
"
"
2 OC to 2Q1
"
186
"
"
OUT
"
"
"
"
2 OC to 2Q2
"
187
"
"
OUT
"
"
"
"
2 OC to 2Q3
"
188
"
"
OUT
"
"
"
"
2 OC to 2Q4
tPLZ
"
189
OUT
4.5 V
"
2
13
"
1 OC to 1Q1
"
190
OUT
"
"
"
"
"
1 OC to 1Q2
"
191
OUT
"
"
"
"
"
1 OC to 1Q3
"
192
OUT
"
"
"
"
"
1 OC to 1Q4
"
193
4.5 V
4.5 V
OUT
"
"
"
"
2 OC to 2Q1
"
194
"
"
OUT
"
"
"
"
2 OC to 2Q2
"
195
"
"
OUT
"
"
"
"
2 OC to 2Q3
"
196
"
"
OUT
"
"
"
"
2 OC to 2Q4
10
tPHL1
6
24
"
tPLH2
8
29
"
tPHL2
8
22
"
Same tests and terminal conditions as for subgroup 9, except TC = +125 .
tPLH3
2
15
"
C
tPHL3
2
15
"
tPZH
4
21
"
tPZL
4
21
"
tPHZ
2
10
"
tPLZ
2
15
"
Same tests and terminal conditions as for subgroup 10, except TC = -55 .
11
C
1/ Pins not referenced are N/C.
2/ IIL limits shall be as follows:
Min/Max limits in for circuit
Test
A
A
B
C
IIL
0/-100
0/-100
0/-200
3/ Method 3011 shall be used, except the output voltage shall be as specified herein, and the output current shall be operating rather than short circuit current. The output
conditions have been chosen to produce a current that closely approximates one-half of the true short circuit output current IOS.
4/ IO limits for circuit C shall be -70 to -110 mA.
5/ Tests shall be performed in sequence, attributes data only.
6/ Outputs shall be high 1.5 V; low 1.5 V.
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