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Technology Conformance Inspection (TCI). |
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|  MIL-M-38510/40B
TABLE II. Electrical test requirements.
Subgroup (see
table III)
MIL-PRF-38535
Class B
test requirements
devices
Interim electrical parameters
1
Final electrical test parameters
1*, 2, 3, 9
Group A test requirements
1, 2, 3, 9
Group B electrical test parameters when
using the method 5005 QCI option
N/A
Group C end-point electrical parameters
1, 2, 3
Additional electrical subgroups for group C
10, 11
periodic inspections
Group D end-point electrical parameters
1, 2, 3
*PDA applies to subgroup 1.
4.4 Technology Conformance Inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, 6, 7, and 8 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. Subgroups 3 and 4 shall be added to group C inspection parameters for class B devices and shall consist
of the tests, conditions, and limits specified for subgroups 10 and 11 of group A. The sample size series
number shall be 5 (45 devices accept on 0).
c. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be
as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
5
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