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|  MIL-M-38510/505C
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with. MIL-PRF-38535
or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall
not effect the form, fit, or function as described herein.
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. Qualification
data for subgroups 7, 8, 9, 10, and 11 shall be attributes only.
4.3 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted prior to
qualification, and conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535.
d. All devices processed by the manufacturer to an altered item drawing shall be programmed prior to burn
in.
4.4 Technology Conformance Inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 of table III of MIL-PRF-38535 shall be omitted.
c. For unprogrammed devices, a sample shall be selected to satisfy programmability requirements prior to
performing subgroups 9, 10, and 11. Twelve devices shall be submitted to programming (see 3.3.2.1). If
more than 2 devices fail to program, the lot shall be rejected. At the manufacturers option, the sample may be
increased to 24 total devices with no more than 4 total device failures allowable.
d. For unprogrammed devices, 10 devices from the programmability sample shall be submitted to the
requirements of the specified tests of subgroups 1, 2, and 3 designated for programmed devices only. If any
device fails, the lot shall be rejected. At the manufacturers option, the sample may be increased to 20 total
devices with no more than 2 total devices failing.
e. For unprogrammed devices, 10 devices from the programmability sample shall be submitted to the
requirements of group A, subgroups 9, 10, and 11. If more than two total devices fail, the lot shall be rejected.
At the manufacturers option the sample may be increased to 20 total devices with no more than four total
device failures allowable.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
a. Electrical parameters shall be as specified in table II herein.
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