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MIL-M-38510/653B
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-
PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a. Tests shall be performed in accordance with table II herein.
b. Subgroups 5 and 6 shall be omitted.
c. Subgroup 4 (CIN, CO, and CC measurements) shall be measured only for initial qualification and after process
or design changes that may affect input capacitance. Capacitance shall be measured between the designated
terminal and GND at a frequency of 1 MHz.
d. Subgroups 9 and 11 shall be measured only for initial qualification and after process or design changes which
may affect dynamic performance.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End-point electrical parameters shall be as specified in table II herein. Delta limits shall apply only to subgroup
1 of group C inspection and shall consist of tests specified in table IV herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit
shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows:
4.5.1 Voltage and current. Unless otherwise specified, all voltages given are referenced to the microcircuit GND
terminal. Currents given are conventional current and positive when flowing into the referenced terminal.
4.5.2 Burn-in and life test cool down procedures. When the burn-in and life tests are completed and prior to removal of
bias voltages, the devices under test (DUT) shall be cooled to within 10C of their power stable condition at room
temperature; then, electrical parameter end-point measurements shall be performed.
TABLE IV. Delta limits at 25C.
Device types
Parameter 1/
All
30 nA
ICC
1/ The above parameters shall be recorded before and after the
required burn-in and life tests to determine deltas (Ć).
4.5.3 Quiescent supply current (ICC test). When performing quiescent supply current measurements (ICC), the meter
shall be placed so that all currents flow through the meter.
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