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Page Title:
Table 3. Group A inspection for device type 01-cont. |
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|  TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
Cases X, 2 1/
2
3
4
6
8
9
10
12
13
14
16
18
19
20
MIL-
Cases A,
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Test limits
Subgroup
Symbol STD-883
B,C,D
Measured
Unit
method
Min
Max
terminal
Test no.
CLR 1
D1
CLK 1
PRE 1
Q1
GND
Q2
PRE 2
CLK 2
D2
CLR 2
Q1
Q2
VCC
10
Fig. 5
124, 145
55
MHz
fMAX
TC = +125C
Fig. 4
126-129
2.0
10.0
ns
tPLH1
Fig. 5 8/
130-133
"
16.0
"
Same tests and terminal conditions as subgroup 9, except TC = +125C and limits are as shown.
tPLH2
Fig. 5 8/
134-137
"
13.0
"
tPHL2
Fig. 5
138-141
"
19.0
"
tPHL3
Fig. 4
142-145
"
12.5
"
tPHL4
tSETUP
8/
Fig. 5
146-149
(H)
tSETUP
"
150-153
"
(L)
t(HOLD)
"
154-157
"
(H)
t(HOLD)
"
158-161
"
(L)
11
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55C.
1/ Cases X and 2 terminals not designated are NC.
2/ C = Normal clock pulse.
D = Momentary connection: 5.0 V to GND to 5.0 V (for subgroup 9, 10, 11. D occurs prior to their input pulses).
E = Data input connected to Q output.
F = Normal input conditioning is 5.0 V, however, momentary logic "0" may be applied for synchronizing test equipment for preconditioning the device.
3/ For circuit B, IOS(max) is 110 mA.
4/ Only a summary of attributes data is required.
5/ Inputs: A = 2.4 V minimum, B = 0.4 V.
6/ Outputs: H ≥ 1.5 V, L ≤ 1.5 V.
7/ fMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
8/ SETUP and HOLD time functionality may be verified by separate tests from propagation delay tests, by monitoring the output at
specified SETUP and HOLD conditions (see fig. 5).
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